Agilent introduces first GC/MS system

Published: 28-Jun-2005

Agilent Technologies has introduced the Agilent 5975 Inert MSD, the first gas chromatograph/mass spectrometer (GC/MS) system featuring a user interface that allows the electronic sharing of application methods.


Agilent Technologies has introduced the Agilent 5975 Inert MSD, the first gas chromatograph/mass spectrometer (GC/MS) system featuring a user interface that allows the electronic sharing of application methods.

This eliminates the need to manually create an application method on new instrumentation and accelerates the transfer and standardisation of methods across laboratories.

The next generation of the 5973 Inert MSD, the Agilent 5975 can download new application solutions from Agilent's website and import them directly into the instrument: a concept called eMethods. Using this method, analysts can also transfer their existing 5973 series MSD methods to the new 5975 inert MSD with a simple software upgrade.

'eMethods allows researchers to tap into Agilent's wealth of application knowledge in a new and efficient way. It unlocks the power of their own customised applications,' said James Yano, GC/MS marketing manager, Agilent's chemical analysis solutions unit. 'By providing a quicker, more productive and error-free process for importing and sharing applications, eMethods maximizes GC/MS productivity.'

The system has a redesigned hyperbolic mass analyser and higher mass range capability, which provide quality data for higher mass applications such as environmental detection of polybrominated diphenyl ethers (PBDEs), a class of chemicals used as flame retardants. It also includes a new vacuum system that pumps hydrogen and helium carrier gas more efficiently; a new flow-control system that automatically adjusts reagent gas flow and allows automated tuning of the ion source, making chemical ionisation as routine as electron impact ionisation, while improving overall sensitivity.

The system also has a new acquisition mode that allows users to obtain Synchronous SIM (selected ion monitoring) data and full-scan data with no loss in sensitivity.

  

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